Gerke S, Micard G, Job R, Hahn G, Terheiden B.  2016.  Capacitance-voltage spectroscopy and analysis of dielectric intrinsic amorphous silicon thin films. Physica Status Solidi (C). 13(10-12):724-728.

Gerke S, Becker H‐ Werner, Rogalla D, Job R, Terheiden B.  2016.  Model based prediction of the trap limited diffusion of hydrogen in post-hydrogenated amorphous silicon. Physica Status Solidi - Rapid Research Letters. 10(11):828-832.